Work

Attack Buffer and Error Elimination Control for Microgrid FDI Attacks

Year: 2025

Type: article

Source: International Journal of Circuit Theory and Applications

DOI: 10.1002/cta.4562

Authors: Chenming Liu, Yinghao Shan, Jiefeng Hu

Institutions: Donghua University, Federation University

Language: English

Topic: Smart Grid Security and Resilience

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G6567137335

OpenAlex ID: W4409662738

FWCI:

Cites: 35

Cited by:

Related to: 10