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Enhanced plasma resistance of uniform ALD-Y2O3 thin films for chamber components’ coatings

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Year: 2025
Type: article
Source: Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
DOI: 10.1116/6.0004256
Authors: Jun-Hyeok Jeon, Sun Gil Kim, Hyun-Mi Kim, Hye-Young Kim, Chang-sub Park, Yong Soo Lee, Seul-Gi Kim, Hyeongkeun Kim, Jae-Boong Choi
Institutions: Korea Electronics Technology Institute, Sungkyunkwan University, Shinko Seiki Co., Ltd. (Japan)
Language: English

Topic: Semiconductor materials and devices
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funder: Ministry of Trade, Industry and Energy
Awards: G3170114606, G3840362972, G6823130731
OpenAlex ID: W4409669253
FWCI: 0.68
Cites: 45
Cited by: 3
Related to: 10
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