3D model assessment of a directional etch patterning process
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3055672
Authors: Matthew Gallagher, Shubhankar Das, Victor M. Blanco Carballo, Mircea V. Dusa
Institution: IMEC
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409677381
