New insights into high electron affinity photoacid generators and their impact on EUV chemically amplified resist performance
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3051514
Institution: DuPont (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409679233
