Work

Optical fiber-enhanced photoreflectance and contactless electroreflectance measurements of van der Waals crystals and III-V semiconductor materials

Year: 2025

Type: article

Abstract: Among many different applications, optical fibers have not been widely utilized in fundamental optical studies of semiconductors. Their integration into different scientific domains typically leads to the miniaturization and simplification of measurement systems. Here, the optical fiber is integrated into a modulation spectroscopy setup, allowing for the optical characterization of semiconductor materials including van der Waals crystals. Investigating fibers with different core diameters in photoreflectance experiments revealed distinct advantages: fibers with smaller cores are suitable for scanning samples with micrometer spatial resolution, while larger cores facilitate maintaining a greater distance from the sample. In contactless electroreflectance measurements, using fibers enhances the signal and allows for precise electrode positioning, significantly reducing the risk of electrical breakdown . Most importantly, integrating fiber allowed for decoupling the measurement zone from the experimental setup. This pioneering approach not only refines optical spectroscopy methodologies but also optimizes experimental conditions while prioritizing safety and integrity.

Source: Measurement

DOI: 10.1016/j.measurement.2025.117678

Authors: K. Ciesiołkiewicz, J. Kopaczek, S.J. Zelewski, R. Kudrawiec

Institution: Wrocław University of Science and Technology

Language: English

Topic: Semiconductor Quantum Structures and Devices

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $3,760

Funders: Narodowe Centrum Nauki, Narodowym Centrum Nauki