Work

Research on PCB defect detection method based on principal component analysis

Year: 2025

Type: conference-paper

Source: IEEE Information Technology and Mechatronics Engineering Conference (ITOEC)

DOI: 10.1109/itoec63606.2025.10967656

Author: Lianling Zhou

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409723711

FWCI: 7.578

Cites: 2

Cited by: 3

Related to: 10