Work

Impact of Voltage Class on SiC MOSFET Paralleled Chip Temperature Imbalance

Year: 2025

Type: conference-paper

Source: IEEE International Workshop on Integrated Power Packaging (IWIPP)

DOI: 10.1109/iwipp61784.2025.10971466

Authors: Rowan Aldridge, Nick Baker

Institution: University of Alabama

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409724122

FWCI: 4.554

Cites: 10

Cited by: 2

Related to: 10