Work

Thread Surface Defect Detection Based on Image Processing

Year: 2025

Type: conference-paper

Source: IEEE Information Technology and Mechatronics Engineering Conference (ITOEC)

DOI: 10.1109/itoec63606.2025.10967740

Authors: YuFeng Tang, Bin Zheng

Institution: Panzhihua University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409724140

FWCI: 2.448

Cites: 5

Cited by: 1

Related to: 10