Work

Multi-Chip Temperature Imbalance of SiC MOSFETs in MOSFET vs. Body-Diode Conduction

Year: 2025

Type: conference-paper

Source: IEEE International Workshop on Integrated Power Packaging (IWIPP)

DOI: 10.1109/iwipp61784.2025.10971548

Authors: Nick Baker, Francesco Iannuzzo, Szymon Bęczkowski

Institutions: University of Alabama, Politecnico di Torino, Aalborg University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409724395

FWCI:

Cites: 32

Cited by:

Related to: 10