Work

Failure Mechanism Analysis and Reliability Assessment of MEMS Accelerometers

Year: 2025

Type: article

Source: Quality and Reliability Engineering International

DOI: 10.1002/qre.3794

Authors: Jing Li, Guoguang Lu, Junzuo Liu, Sajawal Gul Niazi, Ying Zeng

Institutions: University of Electronic Science and Technology of China, China Electronic Product Reliability and Environmental Test Institute, Ministry of Industry and Information Technology, Southwest Jiaotong University

Language: English

Topic: Advanced MEMS and NEMS Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science and Technology Major Project

Award: G2855313410

OpenAlex ID: W4409729877

FWCI: 0.462

Cites: 30

Cited by: 2

Related to: 10