Work

LSTM combined with attention mechanism for power MOSFET lifetime prediction

Year: 2025

Type: conference-paper

DOI: 10.1117/12.3066049

Authors: Wen Zhao, Qian Li, Jie Zhang, Tao Lu, Binghui Zhao, Yu Sun, Haoru Song

Institution: Guangdong Power Grid Company (China)

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409731209

FWCI:

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