Semiconductor image analysis using data-efficient machine learning
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3050624
Authors: Songhyun Yu, Sangho Yoon, Sungjin Lim, Hoonseok Park, Subong Shon, Suil Son, Chulmoo Kang, Yoonsung Bae, Hansaem Park, Sungsik Jo, Seungwoo Oh, Dongryul Lee, Seonghoon Jeong, Sungho Lee, Myungjun Lee
Institution: Samsung Electronics (South Korea)
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409759267