Work

Leveraging AI and ML to transform Twinscan into an inline macro defect inspection system

Year: 2025

Type: conference-paper

DOI: 10.1117/12.3050694

Authors: Auguste Lam, Aline Gouantes, Sebastien Doloy, Vincent Morin

Institution: STMicroelectronics (France)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409759327

FWCI:

Cites: 10

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Related to: 10