Work

Analyzing Trap Charge Impact in Dopant Hetero-Material TFET via Interface Engineering

Year: 2025

Type: conference-paper

DOI: 10.1109/icsc64553.2025.10968519

Authors: Dipanshu Kosre, Bandi Venkata Chandan, Ajay Singh Raghuvanshi, Kaushal Kumar Nigam

Institution: National Institute of Technology Raipur

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409759761

FWCI: 2.358

Cites: 12

Cited by: 1

Related to: 10