Work

Zero Memory Overhead Approach for Protecting Vision Transformer Parameters Against Bit-Flip Faults

Year: 2025

Type: conference-paper

Source: International Computer Conference, Computer Society of Iran (CSICC)

DOI: 10.1109/csicc65765.2025.10967400

Authors: Fereshteh Baradaran, Mohsen Raji, Azadeh Baradaran, Arezoo Baradaran, Reihaneh Akbarifard

Institution: Shiraz University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409761498

FWCI: 6.901

Cites: 12

Cited by: 3

Related to: 10