Work

Memristive Switching Behavior of MoO3 Decorated PSi Heterostructure and Impact of Temperature on Device Reliability

Year: 2025

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2025.3563885

Authors: B Sharmila, Kr. Sarkar Achintya, Priyanka Dwivedi

Institution: Indian Institute of Information Technology Sri City

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Ministry of Electronics and Information technology

Award: G165845010

OpenAlex ID: W4409761932

FWCI:

Cites: 31

Cited by:

Related to: 10