Work

Assessment of a Metal-Strip on Stack Gate Oxide Underlap TFET for Improvement of Analog/RF and Linearity Performance

Year: 2025

Type: conference-paper

DOI: 10.1109/icsc64553.2025.10967939

Authors: Priyanka Verma, Satyendra Kumar

Institution: Jaypee Institute of Information Technology

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409762355

FWCI:

Cites: 27

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Related to: 10