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Improved Welding Defects Recognition with Transfer Learning Based You Only Look Once Version 5

Year: 2025

Type: conference-paper

Source: International Conference on Integrated Circuits and Communication Systems (ICICACS)

DOI: 10.1109/icicacs65178.2025.10968402

Authors: Pavan Srikanth SubbaRaju Patchamatla, Raami Riadhusin, N. Subhash Chandra, Pramodhini R, K. Alagarraja

Institutions: Iraqi University, Nitte Meenakshi Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409762670

FWCI: 15.16

Cites: 18

Cited by: 6

Related to: 10