Work

A New Matrix Percolation Model for Dielectric Breakdown With Nonuniform Defect Generation

Year: 2025

Type: article

Source: IEEE Electron Device Letters

DOI: 10.1109/led.2025.3563934

Authors: Chu Yan, Yi Zhao

Institution: Zhejiang University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science and Technology Major Project

Award: G7250844229

OpenAlex ID: W4409762810

FWCI: 0.462

Cites: 24

Cited by: 2

Related to: 10