Work

Experimental Demonstration of Conjugate Structured Illumination Microscopy (c-SIM) for Sensing Deep Subwavelength Perturbations in Background Nanopatterns

Year: 2025

Type: article

Source: ACS Photonics

DOI: 10.1021/acsphotonics.5c00227

Authors: Jinsong Zhang, Renjie Zhou, Nicholas X. Fang, Weijie Deng, Jinlong Zhu, Shiyuan Liu

Institutions: Huazhong University of Science and Technology, Chinese University of Hong Kong, University of Hong Kong, Chinese Academy of Sciences, Changchun Institute of Optics, Fine Mechanics and Physics, Optics Valley Laboratory

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Shenzhen Fundamental Research Program, National Key Research and Development Program of China

Awards: G4660450540, G8659983331, G8966773332

OpenAlex ID: W4409766384

FWCI: 2.172

Cites: 47

Cited by: 6

Related to: 10