Work

Automatic test case generation for multiple coverage criteria: towards more efficient bug localization

Year: 2025

Type: conference-paper

Source: International Conference on Computer Application and Information Security (ICCAIS)

DOI: 10.1117/12.3060785

Authors: Zhonghao Guo, Siwei Ji, Xinyue Xu, Xiangxian Chen, Chenge Geng

Institution: Zhejiang University

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409785075

FWCI:

Cites: 14

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Related to: 10