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Yield Analysis and Fault Isolation With Artificial Intelligence (AI) in Semiconductor Industry

Year: 2025

Type: conference-paper

Source: Proceedings of IEEE Southeastcon

DOI: 10.1109/southeastcon56624.2025.10971710

Authors: Supriyo Karmakar, Sayantani Karmakar

Institutions: City University of New York, Farmingdale State College

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409796167

FWCI:

Cites: 9

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Related to: 10