Evaluation of Few-Shot Learning with Vision Language Models for Needle Bearing Defect Detection
Year: 2025
Type: conference-paper
Source: Proceedings of IEEE Southeastcon
Authors: Balaji Chandrasekaran, Vamanie Perumal
Institution: Indian Institute of Technology Madras
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409796274