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Using Yolo Object Detection with PINN Integration for Thermal-Based Fault Detection in Integrated Circuits

Year: 2025

Type: conference-paper

Source: Proceedings of IEEE Southeastcon

DOI: 10.1109/southeastcon56624.2025.10971680

Authors: Bradley Lorren, Summit Chakravarty, Arjun Joginipelly

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409796406

FWCI: 4.896

Cites: 8

Cited by: 2

Related to: 10