Work

Research on the Mechanism of Electrical Erosion Accelerating Failure in High-Current Pulse Thyristor-Based Switches

Year: 2025

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2025.3565618

Authors: Shiyun Xiao, Yi Liu, Liuxia Li, Fuchang Lin, Yunxin Miao

Institutions: State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Excellent Youth Foundation of Jiangsu Scientific Committee

Award: G794037683

OpenAlex ID: W4409917112

FWCI: 0.226

Cites: 8

Cited by: 1

Related to: 10