A Short-Circuit Protection Method for SiC MOSFET Using Combined V gs and V ds Detection
Year: 2025
Type: article
Authors: Jiaming Xie, Jinxiao Wei, Hao Feng, Binbing Wu, Li Ran
Institutions: Chongqing University, Hefei University of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G6957512314
OpenAlex ID: W4409917166