Year: 2025
Type: article
Abstract: We report the growth and optical characterization of single-crystal BiFe1−xMnxO3 thin films directly on SrTiO3/Si(001) substrates using molecular beam epitaxy. X-ray diffraction confirmed epitaxial growth, film crystallinity, and sharp interface quality. Scanning electron microscopy and energy dispersive X-ray spectroscopy verified uniform film morphology and successful Mn incorporation. Spectroscopic ellipsometry revealed a systematic bandgap reduction with increasing Mn concentration, from 2.7 eV in BiFeO3 to 2.58 eV in BiFe0.74Mn0.26O3, consistent with previous reports on Mn-doped BiFeO3. These findings highlight the potential of BiFe1₋xMnxO3 films for bandgap engineering, advancing their integration into silicon-compatible multifunctional optoelectronic and photovoltaic applications.
Source: Materials
DOI: 10.3390/ma18092022
Authors: Samuel R. Cantrell, John T. Miracle, Ryan J. Cottier, Skyler Lindsey, Nikoleta Theodoropoulou
Institution: Texas State University
Language: English
Field: Materials Science
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $3,137
OpenAlex ID: W4409943368