Work

Real-Time IGBT Module Ageing Characterization Through Temperature Monitoring

Year: 2025

Type: conference-paper

Source: IEEE Applied Power Electronics Conference and Exposition (APEC)

DOI: 10.1109/apec48143.2025.10977126

Authors: Quirc Perez-Farre, Luis F. Gomez-Rivera, Carlos Lopez-Torres, Kai Dannehl, Antoni García-Espinosa, Alejandro Paredes-Camacho

Institutions: Universitat Politècnica de Catalunya, Seat (Spain)

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Industry, innovation and infrastructure, Affordable and clean energy

Open Access status: closed

Funder: Generalitat de Catalunya

OpenAlex ID: W4409991194

FWCI: 2.358

Cites: 13

Cited by: 1

Related to: 10