Work

Design-of-Experiments and ALT plan for reliability qualification of chip resistors based on mission profile of AIMDs

Year: 2025

Type: article

Abstract: Chip resistors are integral components of electronic devices, including Active Implantable Medical Devices. This work, as part of RECOME project, is focusing on developing a methodology for defining accelerated life test plans to qualify chip resistors as per the mission profile of AIMDs. This will be done by combining design of experiments and accelerated life tests associated with failure mechanisms. Defining test protocols, such as thermal cycling, will be a critical component of this work. • A methodology for planning accelerated tests to qualify chip resistors in active implantable medical devices (AIMDs) • Combining design of experiments with accelerated testing • Focusing on failure mechanisms of chip resistors relevant to AIMDS for qualification • Adapting test protocols for chip resistors, such as thermal cycling and electrical overload

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2025.115773

Authors: F.-E. Indmeskine, L. Saintis, A. Kobi, H. Marceau

Institution: Université d'Angers

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDG: Good health and well-being

Open Access status: hybrid

Estimated APC paid: $2,280