Work

Observing In Situ Degradation of Metallized Aluminum Nitride Substrate by Acoustic Emission and Digital Image Correlation

Year: 2025

Type: article

Source: IEEE Transactions on Power Electronics

DOI: 10.1109/tpel.2025.3564917

Authors: Minh Chu Ngo, Hiroyuki Miyazaki, Kiyoshi Hirao, Tatsuki Ohji, Manabu Fukushima

Institution: National Institute of Advanced Industrial Science and Technology

Language: English

Topic: Electronic Packaging and Soldering Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410028548

FWCI:

Cites: 45

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Related to: 10