Work

Post-Irradiation Fault Injection for Complex FPGA Designs

Year: 2025

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2025.3566344

Authors: Nathan Baker, Ethan Campbell, Andrew Wilson, Michael Wirthlin

Institution: Brigham Young University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W4410028552

FWCI: 0.23

Cites: 23

Cited by: 1

Related to: 10