Real-time detection algorithm for industrial PCB defects based on HS-LSKA and global-EMA
Year: 2025
Type: article
Source: Journal of Electronic Imaging
Authors: Wenxuan Yan, Hang Yan, Ning Xu, Xin Su, Aimin Jiang
Institution: Hohai University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G2906944072, G490199994
OpenAlex ID: W4410089594
