Dual-beam photothermal material trace detection method based on self-mixing interference
Year: 2025
Type: article
Source: Applied Optics
DOI: 10.1364/ao.560828
Authors: Yan Zhao, Yunlong Zhi, Hui Zhao, Daming Dong, Jigang Tong, Chunling Tu
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G5202652475
OpenAlex ID: W4410089935
