Temperature-modulated ellipsometry for the measurement of dynamic expansion of nanoscale thin films
Year: 2025
Type: article
Source: Review of Scientific Instruments
DOI: 10.1063/5.0264745
Authors: Jintian Luo, Kun Ye, Jiachen Li, Biao Zuo
Institution: Zhejiang Sci-Tech University
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4410123590