Development of deep learning aided surface reconstruction system for dimensional metrology using sheet of light scanning technique
Year: 2025
Type: article
Authors: Karthikeyan G, Senthilnathan R
Institution: SRM Institute of Science and Technology
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Award: G720699507
OpenAlex ID: W4410142866