Work

Lifetime Prediction of IGBT by BPNN Based on Improved Dung Beetle Optimization Algorithm

Year: 2025

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2025.3567650

Authors: Peng Dai, Junyi Bao, Zheng Gong, Mingchang Gao, Qing Xu

Institution: China University of Mining and Technology

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Foundation of Jiangsu Province, Basic Research Program of Jiangsu Province

Awards: G2898074378, G5452211487, G6432417349

OpenAlex ID: W4410153070

FWCI: 2.771

Cites: 27

Cited by: 12

Related to: 10