Work

Suppressing the Surface Roughness of InZnGeO Film and Enhancing TFT Performance by Stacking InZnGaO Layer

Year: 2025

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2025.3565477

Authors: Zheng Ma, Cong Peng, Fa-Hsyang Chen, Guowen Yan, Lin Xu, Longlong Chen, Rubo Xing, Xifeng Li, Jianhua Zhang

Institutions: Shanghai University, Kunshan Govisionox Optoelectronic (China)

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G4004667468, G6478819551, G7946861727

OpenAlex ID: W4410153238

FWCI: 1.356

Cites: 35

Cited by: 6

Related to: 10