Development of infrared thermal simulation platform for voltage-induced defects in arresters
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3060372
Authors: Xiaoyun Tian, guojun zhang, Zhihui Li, dao Qian, Deqian Dou
Institution: Inner Mongolia Electric Power (China)
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4410154979
