Work

Near-Infrared Photodetection Using an Epsilon-Near-Zero Trapping Effect in Optimized Indium Tin Oxide Films

Year: 2025

Type: article

Source: ACS Applied Materials & Interfaces

DOI: 10.1021/acsami.5c04909

Authors: Yajin Dong, Wenyue Liang, Shifeng Qian, Zikun Xia, Zekang Mo, Ning Tan, Yongyue Huang, Ziwang Tuo, Yunyang Gong, Long Wen, Qin Chen

Institutions: Jinan University, Anhui Normal University

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province, Basic and Applied Basic Research Foundation of Guangdong Province

Awards: G1279841234, G2387474407, G2765543885, G4979430625, G7033524537

OpenAlex ID: W4410210381

FWCI: 0.452

Cites: 52

Cited by: 2

Related to: 10