Work

Dual threshold adaptive update algorithm for eliminating probe edge errors in reflective ptychography

Year: 2025

Type: article

Source: Applied Optics

DOI: 10.1364/ao.560115

Authors: Yihan Zhao, Yanqi Chen, Yunlong Qi, Su Li, Feiyu Duan, Yishi Shi

Institutions: Hebei University of Engineering, Chinese Academy of Sciences, Beihua University

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Chinese Academy of Sciences, University of Chinese Academy of Sciences, National Key Research and Development Program of China, Fundamental Research Funds for the Central Universities

Awards: G113009806, G2500078196, G7583669347

OpenAlex ID: W4410225144

FWCI:

Cites: 33

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Related to: 10