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Deep Learning Approaches to Banana Ripeness Detection

Year: 2025

Type: conference-paper

Source: International Electrical Engineering Congress (iEECON)

DOI: 10.1109/ieecon64081.2025.10987896

Authors: Sirinya Thanyacharoen, Sumetee Jirapattarasakul, Napat Joijinda, Giuseppe Riccardo Leone, Thaweewong Akkaralaertsest, Thaweesak Yingthawornsuk

Institutions: King Mongkut's University of Technology Thonburi, Istituto di Scienza e Tecnologie dell'Informazione "Alessandro Faedo", National Research Council, Rajamangala University of Technology Krungthep

Language: English

Topic: Smart Agriculture and AI

Subfield: Plant Science

Field: Agricultural and Biological Sciences

Domain: Life Sciences

SDG: Zero hunger

Open Access status: closed

OpenAlex ID: W4410228336

FWCI:

Cites: 5

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Related to: 10