Work

Study of Scaling Effects and Reliability Issues in Pre-Amplifier Based Dynamic Comparator for Future High Speed Analog to Digital Converters

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Interdisciplinary Approaches in Technology and Management for Social Innovation (IATMSI)

DOI: 10.1109/iatmsi64286.2025.10984470

Authors: Kuja Uday Sri, J. Ajayan

Institution: SR University

Language: English

Topic: Analog and Mixed-Signal Circuit Design

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410229285

FWCI:

Cites: 15

Cited by:

Related to: 10