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Computationally Efficient System-Level Modeling for Open-Loop Bulk Current Injection (BCI) Testing

Year: 2024

Type: conference-paper

Source: IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS)

DOI: 10.1109/edaps64431.2024.10988487

Authors: Jie Chen, Rajen Murugan, Vishnu Ravinuthula, Willy Bristiel, Bibhu Nayak, Harikiran Muniganti, Dipanjan Gope

Institution: Texas Instruments (United States)

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4410295121

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