An Enhanced EM Framework for Scanning Position Refinement in Ptychography via MCMC Sampling and Posterior Approximation
Year: 2025
Type: conference-paper
Authors: Tianyuan Li, Weilin Huang, Ranhao Zhang, Xueming Li, Yuan Shen
Institution: Tsinghua University
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4410297645
