Work

An Enhanced EM Framework for Scanning Position Refinement in Ptychography via MCMC Sampling and Posterior Approximation

Year: 2025
Type: conference-paper
Institution: Tsinghua University
Language: English
Subfield: Radiation
Open Access status: closed
OpenAlex ID: W4410297645
FWCI:
Cites: 8
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Related to: 10