Work

Application of Machine Learning Technologies for Assembly Quality Analysis in Instrumentation Engineering

Year: 2025

Type: conference-paper

Source: International Youth Conference on Radio Electronics, Electrical and Power Engineering (REEPE)

DOI: 10.1109/reepe63962.2025.10970863

Authors: A. V. Ragutkin, I. M. Sidorov, M. I. Sidorov, E. S. Postnikova, I. I. Fatklislamova, B. A. Edaev

Institutions: MIREA - Russian Technological University, Bauman Moscow State Technical University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410298317

FWCI: 2.48

Cites:

Cited by: 1

Related to: 10