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Multimodal comparative learning chip defect detection algorithm based on GLIP guidance

Year: 2025

Type: article

Source: International Journal of Systems Control and Communications

DOI: 10.1504/ijscc.2025.10071156

Authors: Li Ma, Jingjing Fang, Bingqi Wang, Ziyi He

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410304353

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