Work

A DICE Flip-Flop Design by Resetting Redundancy Hardening for Single Event Upset Tolerance

Year: 2025

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2025.3570099

Authors: Yaohua Xu, Zeteng Liu, Yi Wang, Na Bai, Ye Liu

Institution: Anhui University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410358804

FWCI: 1.586

Cites: 18

Cited by: 7

Related to: 10