Work

Fast CV MSM Technique for Comprehensive Analysis of Bulk Trapping in Low-K Carbon-Doped Dielectrics

Year: 2025

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps48204.2025.10983765

Authors: T. Mota Frutuoso, W. Vandendaele, A. Bond, F. Bringuier, V. Lapras, M. C. Cyrille, C. Fenouillet-Beranger, B. Duriez. X. Garros

Institutions: Commissariat à l'Énergie Atomique et aux Énergies Alternatives, Laboratoire d'Électronique des Technologies de l'Information

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Agence Nationale de la Recherche

Award: NextGen

OpenAlex ID: W4410394209

FWCI: 4.65

Cites: 11

Cited by: 2

Related to: 10