Well-Charging Damage to Capacitors Connected Between VDD and VSS in a Single Power Domain
Year: 2025
Type: conference-paper
Authors: Hsi- Yu Kuo, Yu-Lin Chu, Chien-Jen Wang, Steven Sze Hang Poon, Chun-Wei Yao, Hsuan Chu, Yi-Ching Chen, Yi-Lun Chen, Yu-Ti Su, Chia-Lin Hsu, Tsung-Yuan Chen, Te-Liang Li, Ray Huang, Kuo-Ji Chen, Ming-Hsiang Song, Kejun Xia, Ryan Lu
Institution: Taiwan Semiconductor Manufacturing Company (Taiwan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4410394251