The Importance of Gate Length Choice on NBTI Qualification in GAA-SNS FETs Under Normal and Overclocking Conditions
Year: 2025
Type: conference-paper
Authors: Arnav Shaurya Bisht, Souvik Mahapatra
Institution: Indian Institute of Technology Bombay
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4410394252